Most of those diffraction spots on the Laue X-ray pattern of the synthetic diamond are distributed on four main crystal zones respectively. The main type of crystal defects in this sample are dislocations, and some of them belong to the Frank type. 所得的X射线透射劳埃图上大部分斑点分别分布在四条主晶带上,经分析发现,该金刚石晶体主要的晶体缺陷为位错,并推导出晶体内部存在Frank不全位错。
A method for determining the hexagonal polytypes of silicon carbide using the Laue pattern is described. 本文提出了用X射线劳埃法鉴定SiC六方多型体类型的方法。